Systems
Complete systems used for surface analysis, spectroscopy, physical vapour deposition, chemical vapour deposition and PE CVD.
We also supply custom made systems if needed.
AXIS Technique
The unique magnetic lens of AXIS electron spectrometers has two functions. It provides high collection efficiency and high spatial resolution.
AXIS Supra
The AXIS Supra combines state-of-the-art XPS performance with unrivalled automation and ease of use. This instrument excels in both spectroscopy and imaging modes and has the flexibility to incorporate complementary surface analytical techniques and surface modification accessories.
AXIS Nova
The AXIS Nova is a highly automated x-ray photoelectron spectrometer with uncompromised spectroscopic performance required for demanding research applications.
TOF-SIMS Applications
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface of the sample.
TOF-SIMS Technique
TOF-SIMS is an acronym for the combination of the analytical technique SIMS (Secondary Ion Mass Spectrometry) with Time of Flight mass analysis (TOF)
TOF-SIMS 5
The TOF-SIMS 5 provides detailed elemental and molecular information about surface, thin layers, interfaces of the sample, and gives a full three-dimensional analysis.