Complete systems used for surface analysis, spectroscopy, physical vapour deposition, chemical vapour deposition and PE CVD.
We also supply custom made systems if needed.
The unique magnetic lens of AXIS electron spectrometers has two functions. It provides high collection efficiency and high spatial resolution.
The AXIS Supra combines state-of-the-art XPS performance with unrivalled automation and ease of use. This instrument excels in both spectroscopy and imaging modes and has the flexibility to incorporate complementary surface analytical techniques and surface modification accessories.
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface of the sample.
TOF-SIMS is an acronym for the combination of the analytical technique SIMS (Secondary Ion Mass Spectrometry) with Time of Flight mass analysis (TOF)
- Chemistry Products
- Life Science Products
- Physics Products
- Vacuum Products