Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface of the sample.
Modern life is characterised by continuous development and technological change. The capacity for understanding, controlling and taking advantage of new ideas is essential.
As a result, analytical instrumentation has to expand its performance to fulfill current and future analytical demands. The ION-TOF TOF-SIMS products provide solutions for many of today’s high-tech industries.
Our mission is to develop the technique and expand its potential for future applications. Considerable research effort as well as close co-operation with our customers will continue to create new possibilities, thus keeping our instruments at the leading edge of technology.
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