TOF-SIMS Applications

01 Overview

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface of the sample.

02 Details

Modern life is characterised by continuous development and technological change. The capacity for understanding, controlling and taking advantage of new ideas is essential.

As a result, analytical instrumentation has to expand its performance to fulfill current and future analytical demands. The ION-TOF TOF-SIMS products provide solutions for many of today’s high-tech industries.

Our mission is to develop the technique and expand its potential for future applications. Considerable research effort as well as close co-operation with our customers will continue to create new possibilities, thus keeping our instruments at the leading edge of technology.

Materials

Tasks

Applications

Semiconductors
Polymers
Paint + Coatings
Biomaterials
Pharmaceuticals
Glass
Paper
Metals
Ceramics
etc.
Failure Analysis
Quality Control
Development
Reverse Engineering
Research
etc.
Contamination
Adhesion
Friction
Wettability
Corrosion
Diffusion
Segregation
Cell Chemistry
Biocompatibility
etc.