TOF - SIMS Technique
IONTOF Logo
Secondary Ion Mass Spectrometry with Time of Flight Mass Analysis
TOF-SIMS is an acronym for the combination of the analytical technique SIMS (Secondary Ion Mass Spectrometry) with Time of Flight mass analysis (TOF). In different operational modes - surface spectroscopy, surface imaging, depth profiling, 3D analysis - this analysis technique offers unique features:

Information obtained

  • Detection of all elements and isotopes
  • Chemical information via molecular andcluster ions

Detection limits

  • PPM of a monolayer for elements
  • Sub-fmol for molecules

Detection limits

  • High lateral resolution (<60nm)
  • High surface sensitivity (<1nm)
  • High depth resolution (<1nm)

(JHB) +27 (0) 11 475 1823


(DBN) +27 (0) 31 301 7617


(CPT) +27 (0) 21 461 9607


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